Advanced Scanning Probes for Micro-Nano Science Researches
In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for...
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| Veröffentlicht in: | IEEJ transactions on electrical and electronic engineering 2010-05, Vol.5 (3), p.259-262 |
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| container_title | IEEJ transactions on electrical and electronic engineering |
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| creator | Akiyama, Terunobu Gautsch, Sebastian Parrat, Daniel Imer, Raphaël Vettiger, Peter Staufer, Urs de Rooij, Nicolaas F. |
| description | In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system. The applications of these probes are very versatile, from atomic force microscope for the exploration of Mars to in vivo measurements of human knee cartilage. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc. |
| doi_str_mv | 10.1002/tee.20527 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_753628013</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>753628013</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3637-42ffb4ae034eac60f0d6e98822d4fab56bc33f25f8c81789f71791086e72770d3</originalsourceid><addsrcrecordid>eNp1kE1PwkAQhjdGExE9-A96Mx4K-9Hubr0RAqhBNIJw3Gy3s1otLeyCyr-3WuXmad5knncyeRA6J7hDMKbdDUCH4piKA9QiCSNhlEhyuM-CHaMT718xjjiTsoWuetm7Lg1kwdTosszL5-DBVSn4wFYuuMuNq8KJLqt6nUPNBY_gQTvzAv4UHVldeDj7nW30NBzM-tfh-H500--NQ8M4E2FErU0jDZhFoA3HFmccEikpzSKr05inhjFLYyuNJEImVhCRECw5CCoEzlgbXTR3V65ab8Fv1DL3BopCl1BtvRIx41RiwmrysiHrr713YNXK5Uvtdopg9a1H1XrUj56a7TbsR17A7n9QzQaDv0bYNHK_gc99Q7s3xQUTsVpMRmp6O5uL4WKuGPsCI9J0aw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>753628013</pqid></control><display><type>article</type><title>Advanced Scanning Probes for Micro-Nano Science Researches</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Akiyama, Terunobu ; Gautsch, Sebastian ; Parrat, Daniel ; Imer, Raphaël ; Vettiger, Peter ; Staufer, Urs ; de Rooij, Nicolaas F.</creator><creatorcontrib>Akiyama, Terunobu ; Gautsch, Sebastian ; Parrat, Daniel ; Imer, Raphaël ; Vettiger, Peter ; Staufer, Urs ; de Rooij, Nicolaas F.</creatorcontrib><description>In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system. The applications of these probes are very versatile, from atomic force microscope for the exploration of Mars to in vivo measurements of human knee cartilage. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.</description><identifier>ISSN: 1931-4973</identifier><identifier>EISSN: 1931-4981</identifier><identifier>DOI: 10.1002/tee.20527</identifier><language>eng</language><publisher>Hoboken: Wiley Subscription Services, Inc., A Wiley Company</publisher><subject>AFM ; array probe ; Biomedical materials ; cantilever ; conductive probe ; Exploration ; Human ; In vivo testing ; In vivo tests ; Mars ; piezoresistive probe ; Planetary probes ; Scanning ; self-sensing probe</subject><ispartof>IEEJ transactions on electrical and electronic engineering, 2010-05, Vol.5 (3), p.259-262</ispartof><rights>Copyright © 2010 Institute of Electrical Engineers of Japan</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c3637-42ffb4ae034eac60f0d6e98822d4fab56bc33f25f8c81789f71791086e72770d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Ftee.20527$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Ftee.20527$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,777,781,1412,27905,27906,45555,45556</link.rule.ids></links><search><creatorcontrib>Akiyama, Terunobu</creatorcontrib><creatorcontrib>Gautsch, Sebastian</creatorcontrib><creatorcontrib>Parrat, Daniel</creatorcontrib><creatorcontrib>Imer, Raphaël</creatorcontrib><creatorcontrib>Vettiger, Peter</creatorcontrib><creatorcontrib>Staufer, Urs</creatorcontrib><creatorcontrib>de Rooij, Nicolaas F.</creatorcontrib><title>Advanced Scanning Probes for Micro-Nano Science Researches</title><title>IEEJ transactions on electrical and electronic engineering</title><addtitle>IEEJ Trans Elec Electron Eng</addtitle><description>In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system. The applications of these probes are very versatile, from atomic force microscope for the exploration of Mars to in vivo measurements of human knee cartilage. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.</description><subject>AFM</subject><subject>array probe</subject><subject>Biomedical materials</subject><subject>cantilever</subject><subject>conductive probe</subject><subject>Exploration</subject><subject>Human</subject><subject>In vivo testing</subject><subject>In vivo tests</subject><subject>Mars</subject><subject>piezoresistive probe</subject><subject>Planetary probes</subject><subject>Scanning</subject><subject>self-sensing probe</subject><issn>1931-4973</issn><issn>1931-4981</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp1kE1PwkAQhjdGExE9-A96Mx4K-9Hubr0RAqhBNIJw3Gy3s1otLeyCyr-3WuXmad5knncyeRA6J7hDMKbdDUCH4piKA9QiCSNhlEhyuM-CHaMT718xjjiTsoWuetm7Lg1kwdTosszL5-DBVSn4wFYuuMuNq8KJLqt6nUPNBY_gQTvzAv4UHVldeDj7nW30NBzM-tfh-H500--NQ8M4E2FErU0jDZhFoA3HFmccEikpzSKr05inhjFLYyuNJEImVhCRECw5CCoEzlgbXTR3V65ab8Fv1DL3BopCl1BtvRIx41RiwmrysiHrr713YNXK5Uvtdopg9a1H1XrUj56a7TbsR17A7n9QzQaDv0bYNHK_gc99Q7s3xQUTsVpMRmp6O5uL4WKuGPsCI9J0aw</recordid><startdate>201005</startdate><enddate>201005</enddate><creator>Akiyama, Terunobu</creator><creator>Gautsch, Sebastian</creator><creator>Parrat, Daniel</creator><creator>Imer, Raphaël</creator><creator>Vettiger, Peter</creator><creator>Staufer, Urs</creator><creator>de Rooij, Nicolaas F.</creator><general>Wiley Subscription Services, Inc., A Wiley Company</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>201005</creationdate><title>Advanced Scanning Probes for Micro-Nano Science Researches</title><author>Akiyama, Terunobu ; Gautsch, Sebastian ; Parrat, Daniel ; Imer, Raphaël ; Vettiger, Peter ; Staufer, Urs ; de Rooij, Nicolaas F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3637-42ffb4ae034eac60f0d6e98822d4fab56bc33f25f8c81789f71791086e72770d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>AFM</topic><topic>array probe</topic><topic>Biomedical materials</topic><topic>cantilever</topic><topic>conductive probe</topic><topic>Exploration</topic><topic>Human</topic><topic>In vivo testing</topic><topic>In vivo tests</topic><topic>Mars</topic><topic>piezoresistive probe</topic><topic>Planetary probes</topic><topic>Scanning</topic><topic>self-sensing probe</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Akiyama, Terunobu</creatorcontrib><creatorcontrib>Gautsch, Sebastian</creatorcontrib><creatorcontrib>Parrat, Daniel</creatorcontrib><creatorcontrib>Imer, Raphaël</creatorcontrib><creatorcontrib>Vettiger, Peter</creatorcontrib><creatorcontrib>Staufer, Urs</creatorcontrib><creatorcontrib>de Rooij, Nicolaas F.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEJ transactions on electrical and electronic engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Akiyama, Terunobu</au><au>Gautsch, Sebastian</au><au>Parrat, Daniel</au><au>Imer, Raphaël</au><au>Vettiger, Peter</au><au>Staufer, Urs</au><au>de Rooij, Nicolaas F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Advanced Scanning Probes for Micro-Nano Science Researches</atitle><jtitle>IEEJ transactions on electrical and electronic engineering</jtitle><addtitle>IEEJ Trans Elec Electron Eng</addtitle><date>2010-05</date><risdate>2010</risdate><volume>5</volume><issue>3</issue><spage>259</spage><epage>262</epage><pages>259-262</pages><issn>1931-4973</issn><eissn>1931-4981</eissn><abstract>In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system. The applications of these probes are very versatile, from atomic force microscope for the exploration of Mars to in vivo measurements of human knee cartilage. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.</abstract><cop>Hoboken</cop><pub>Wiley Subscription Services, Inc., A Wiley Company</pub><doi>10.1002/tee.20527</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1931-4973 |
| ispartof | IEEJ transactions on electrical and electronic engineering, 2010-05, Vol.5 (3), p.259-262 |
| issn | 1931-4973 1931-4981 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_753628013 |
| source | Wiley Online Library Journals Frontfile Complete |
| subjects | AFM array probe Biomedical materials cantilever conductive probe Exploration Human In vivo testing In vivo tests Mars piezoresistive probe Planetary probes Scanning self-sensing probe |
| title | Advanced Scanning Probes for Micro-Nano Science Researches |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T20%3A44%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Advanced%20Scanning%20Probes%20for%20Micro-Nano%20Science%20Researches&rft.jtitle=IEEJ%20transactions%20on%20electrical%20and%20electronic%20engineering&rft.au=Akiyama,%20Terunobu&rft.date=2010-05&rft.volume=5&rft.issue=3&rft.spage=259&rft.epage=262&rft.pages=259-262&rft.issn=1931-4973&rft.eissn=1931-4981&rft_id=info:doi/10.1002/tee.20527&rft_dat=%3Cproquest_cross%3E753628013%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=753628013&rft_id=info:pmid/&rfr_iscdi=true |