Advanced Scanning Probes for Micro-Nano Science Researches

Advanced Scanning Probes for Micro-Nano Science Researches

In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for...

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Veröffentlicht in:IEEJ transactions on electrical and electronic engineering 2010-05, Vol.5 (3), p.259-262
Hauptverfasser: Akiyama, Terunobu, Gautsch, Sebastian, Parrat, Daniel, Imer, Raphaël, Vettiger, Peter, Staufer, Urs, de Rooij, Nicolaas F.
Format: Artikel
Sprache:eng
Schlagworte:
AFM
array probe
Biomedical materials
cantilever
conductive probe
Exploration
Human
In vivo testing
In vivo tests
Mars
piezoresistive probe
Planetary probes
Scanning
self-sensing probe
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Beschreibung
Zusammenfassung:In this study, we introduce five unique scanning probes developed in our laboratory for different fields of application. These probes are the results of excellent collaborations with many external partners. Each probe possesses many advanced features that one can hardly obtain with plane probes for conventional optical deflection system. The applications of these probes are very versatile, from atomic force microscope for the exploration of Mars to in vivo measurements of human knee cartilage. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.
ISSN:1931-4973
1931-4981
DOI:10.1002/tee.20527