Thermally induced birefringence and stress in poly(methyl methacrylate) waveguides on oxidized silicon substrates

A thermally induced birefringence in a poly(methyl methacrylate) waveguide has been observed. From polarization measurements made at the output of a waveguide in the range 20-60 degrees C, a value for Delta(n(TE) - n(TM))/DeltaT of 1.1 x 10(-6) degrees C(-1) has been calculated. After waveguide prep...

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Veröffentlicht in:Applied Optics 1993-01, Vol.32 (3), p.322-326
Hauptverfasser: PINCENTI, J. C, SANJAY GOEL, NAYLOR, D. L
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Sprache:eng
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