Thermally induced birefringence and stress in poly(methyl methacrylate) waveguides on oxidized silicon substrates

A thermally induced birefringence in a poly(methyl methacrylate) waveguide has been observed. From polarization measurements made at the output of a waveguide in the range 20-60 degrees C, a value for Delta(n(TE) - n(TM))/DeltaT of 1.1 x 10(-6) degrees C(-1) has been calculated. After waveguide prep...

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Veröffentlicht in:	Applied Optics 1993-01, Vol.32 (3), p.322-326
Hauptverfasser:	PINCENTI, J. C, SANJAY GOEL, NAYLOR, D. L
Format:	Artikel
Sprache:	eng
Schlagworte:	Application fields Applied sciences Circuit properties Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Integrated optics. Optical fibers and wave guides Optical and optoelectronic circuits Polymer industry, paints, wood Technology of polymers
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Beschreibung
Zusammenfassung:	A thermally induced birefringence in a poly(methyl methacrylate) waveguide has been observed. From polarization measurements made at the output of a waveguide in the range 20-60 degrees C, a value for Delta(n(TE) - n(TM))/DeltaT of 1.1 x 10(-6) degrees C(-1) has been calculated. After waveguide preparation the underlying substrate was found to have a bow. By measuring changes in the bow caused by temperature in the range 20-60 degrees , we have calculated a value for the change in stress in the polymethyl methacrylate film of 0.18 MPa/ degrees C. By relating polarization to stress, changes in stress as small as 90 kPa can be measured.
ISSN:	0003-6935 1559-128X 1539-4522
DOI:	10.1364/AO.32.000322