Sputtered films of PdMn for thermometry and bolometry

Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness less than or equal to 1.0 mu m) show significant domain scale noise below the Curie Temperature, T sub(c), while th...

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Veröffentlicht in:Journal of low temperature physics 2002, Vol.126 (1-2), p.649-654
Hauptverfasser: NELSON, R. C, SERGATSKOV, D. A, DUNCAN, R. V
Format: Artikel
Sprache:eng
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Zusammenfassung:Measurements of the magnetic sensitivity of thin sputtered films of PdMn alloy demonstrate the viability of this material for high resolution thermometry. The thinnest films (thickness less than or equal to 1.0 mu m) show significant domain scale noise below the Curie Temperature, T sub(c), while thicker films (thickness greater than or equal to 10 mu m) show reliable non-hysteretic behavior throughout the temperature range of interest. The thin films show the effects of demagnetization with the field perpendicular to the surface, but a fine screen in this orientation shows good response with no evidence of saturation and a manageable degree of demagnetization.
ISSN:0022-2291
1573-7357
DOI:10.1023/A:1013795924263