Optical properties of oxygenated amorphous cadmium telluride thin films
Oxygenated cadmium telluride (CdTe:O) thin films are prepared by radio-frequency (RF) sputtering from a polycrystalline CdTe target in an atmosphere composed of a mixture of argon, nitrogen and oxygen gases. X-ray diffraction analysis showed that as-deposited films are amorphous when deposited in th...
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Veröffentlicht in: | Solar energy materials and solar cells 1997-01, Vol.45 (4), p.341-352 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Oxygenated cadmium telluride (CdTe:O) thin films are prepared by radio-frequency (RF) sputtering from a polycrystalline CdTe target in an atmosphere composed of a mixture of argon, nitrogen and oxygen gases. X-ray diffraction analysis showed that as-deposited films are amorphous when deposited in the presence of nitrogen. X-ray photoelectron spectroscopy analysis revealed that the layers do not contain any nitrogen while the chemical composition of the films depends strongly on the partial pressure of N
2 used during sputtering. finally, optical transmission measurements in the IR-Visible region showed that the optical constants of the samples vary considerably with their oxygen contents. X-ray reflectometry studies enabled us to correlate some of these variations with the density of the layers. |
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ISSN: | 0927-0248 1879-3398 |
DOI: | 10.1016/S0927-0248(96)00080-3 |