Spiral sampling as a fast way of data acquisition in surface topography

In this paper the application of spiral sampling in surface topography measurements is presented. It is a fast way of topography assessment by means of stylus profilometers. In all of the currently used instruments, sampling is based upon a rectangular grid, which is relatively easy to execute, but very time consuming. Spiral sampling offers a potential solution to solve this problem. For this reason it was necessary to create an algorithm for data collection, transmission and processing as well as to construct a measuring setup. This method was elaborated for nominally flat elements. The comparison analysis between a rectangular grid and a spiral one shows that the results of measurements can be similar with up to 70% less time consumption.