Synergism of transmission measurements with spectroscopic ellipsometry measurements in the analysis of a nearly opaque bimetal film stack on glass
For a bimetal stack (Pt) and (Au) which is nearly opaque, we used transmission measurements along with spectroscopic ellipsometry measurements to determine the thicknesses of each metal layer as well as the optical constants of both materials. The key role of the transmission measurements is discuss...
Gespeichert in:
Veröffentlicht in: | Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2000-05, Vol.18 (3), p.946-950 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | For a bimetal stack (Pt) and (Au) which is nearly opaque, we used transmission measurements along with spectroscopic ellipsometry measurements to determine the thicknesses of each metal layer as well as the optical constants of both materials. The key role of the transmission measurements is discussed. |
---|---|
ISSN: | 0734-2101 1520-8559 |
DOI: | 10.1116/1.582280 |