Device and Design Optimization for AlGaN/GaN X-Band-Power-Amplifiers with High Efficiency

The design, realization and characterization of dual-stage X-band high-power and highly-efficient monolithic microwave integrated circuit (MMIC) power amplifiers (PAs) with AlGaN/GaN high electronic mobility transistors (HEMTs) is presented. These high power amplifiers (HPAs) are based on a precise...

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Veröffentlicht in:Journal of Infrared, Millimeter, and Terahertz Waves Millimeter, and Terahertz Waves, 2010-03, Vol.31 (3), p.367-379
Hauptverfasser: Kühn, Jutta, van Raay, Friedbert, Quay, Rüdiger, Kiefer, Rudolf, Mikulla, Michael, Seelmann-Eggebert, Matthias, Bronner, Wolfgang, Schlechtweg, Michael, Ambacher, Oliver, Thumm, Manfred
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Sprache:eng
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Zusammenfassung:The design, realization and characterization of dual-stage X-band high-power and highly-efficient monolithic microwave integrated circuit (MMIC) power amplifiers (PAs) with AlGaN/GaN high electronic mobility transistors (HEMTs) is presented. These high power amplifiers (HPAs) are based on a precise investigation of circuit-relevant HEMT behavior using two different field-plate variants and its effects on PA performance as well as optimization of HPA driver stage size which also has a deep impact on the entire HPA. Two broadband (3 GHz) MMICs with different field-plate variants and two narrowband (1 GHz) PAs with different driver- to final-stage gate-width ratio are realized with a maximum output power of 19-23 W, a maximum power-added efficiency (PAE) of ≥40%, and an associated power gain of 17 dB at X-band. Furthermore, two 1 mm test transistors of the same technology with the mentioned field-plate variants and a 1 mm test MMIC support VSWR-ratio tests of 6:1 and 4:1, respectively.
ISSN:1866-6892
1572-9559
1866-6906
DOI:10.1007/s10762-009-9583-6