A Sting in the Tail of Electron Tracks

Low-energy electrons produce complex DNA damage. Boudaiffa et al in a study have lowered the energy of electrons incident on DNA to 3 eV (an electron energy far below that used in previous studies).

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Science (American Association for the Advancement of Science) 2000-03, Vol.287 (5458), p.1603-1604
Hauptverfasser: Michael, Barry D., O'Neill, Peter
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Low-energy electrons produce complex DNA damage. Boudaiffa et al in a study have lowered the energy of electrons incident on DNA to 3 eV (an electron energy far below that used in previous studies).
ISSN:0036-8075
1095-9203
DOI:10.1126/science.287.5458.1603