Surface structure of plasma-etched (211)B HgCdTe

The surface of (211)B HgCdTe has been studied by reflection high-energy electron diffraction (RHEED) and atomic force microscopy (AFM). RHEED analysis of the as-grown Hg-rich molecular beam epitaxy (MBE) (211)B HgCdTe suggests the surface reconstructs by additional Hg incorporation. The plasma-etche...

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Veröffentlicht in:	Journal of electronic materials 2005-06, Vol.34 (6), p.726-732
Hauptverfasser:	BENSON, J. D, STOLTZ, A. J, DINAN, J. H, VARESI, J. B, ALMEIDA, L. A, SMITH, E. P. G, JOHNSON, S. M, MARTINKA, M, KALECZYC, A. W, MARKUNAS, J. K, BOYD, P. R
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Arrays Diffraction Electronics Exact sciences and technology Materials Mercury cadmium telluride Molecular beam epitaxy Plasma etching Sensors
Online-Zugang:	Volltext
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