Enhanced flux pinning in MOCVD-YBCO films through Zr additions: systematic feasibility studies

Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-delta (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmi...

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Veröffentlicht in:Superconductor science & technology 2010-01, Vol.23 (1), p.014005-014005 (7)
Hauptverfasser: Aytug, T, Paranthaman, M, Specht, E D, Zhang, Y, Kim, K, Zuev, Y L, Cantoni, C, Goyal, A, Christen, D K, Maroni, V A, Chen, Y, Selvamanickam, V
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Sprache:eng
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Zusammenfassung:Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-delta (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions < =7.5 mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO3 nanodots.
ISSN:0953-2048
1361-6668
DOI:10.1088/0953-2048/23/1/014005