Enhanced flux pinning in MOCVD-YBCO films through Zr additions: systematic feasibility studies
Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-delta (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmi...
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Veröffentlicht in: | Superconductor science & technology 2010-01, Vol.23 (1), p.014005-014005 (7) |
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Sprache: | eng |
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Zusammenfassung: | Systematic effects of Zr additions on the structural and flux pinning properties of YBa2Cu3O7-delta (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions < =7.5 mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO3 nanodots. |
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ISSN: | 0953-2048 1361-6668 |
DOI: | 10.1088/0953-2048/23/1/014005 |