Micro-CT of Pseudocneorhinus bifasciatus by projection X-ray microscopy
The projection X-ray microscope utilises a very small X-ray source emitted from a thin (0.1–3 µm) target metal film excited by the focused electron beam of a scanning electron microscope. When an object is placed just below the target metal film, the diverging X-rays enlarge the shadow of the object...
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Veröffentlicht in: | Journal of electron microscopy 2005-08, Vol.54 (4), p.379-383 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The projection X-ray microscope utilises a very small X-ray source emitted from a thin (0.1–3 µm) target metal film excited by the focused electron beam of a scanning electron microscope. When an object is placed just below the target metal film, the diverging X-rays enlarge the shadow of the object. Because no X-ray optics such as a zone-plate is used, the focal depth is, in principle, infinitely large. We exploited this to apply projection X-ray microscopy to three-dimensional (3-D) structure analysis by means of cone-beam computed tomography. The projection images of a small arthropod (Pseudocneorhinus bifasciatus, 5 mm in length), was recorded at 3° increments over the whole range (360°) of a stepping-motor-controlled sample rotator. A 3-D image was reconstructed from corn-beam projections using a filtered back-projection algorithm. The reconstructed 3-D image showed in detail the internal structure of an opaque object. |
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ISSN: | 0022-0744 2050-5698 1477-9986 2050-5701 |
DOI: | 10.1093/jmicro/dfi047 |