Electron Tomography of Nanostructured Materials – Towards a Quantitative 3D Analysis with Nanometer Resolution

Electron tomography has developed into a powerful technique to image the 3D structure of complex materials with nanometer resolution. Both, TEM and HAADF-STEM tomography exhibit tremendous possibilities to visualize nanostructured materials for a wide range of applications. Electron tomography is no...

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Veröffentlicht in:Materials science forum 2010-01, Vol.638-642, p.2517-2522
Hauptverfasser: Rozeveld, Steve, Niemeyer, Dirk, Kübel, Christian, Cieslinski, Robert
Format: Artikel
Sprache:eng
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Zusammenfassung:Electron tomography has developed into a powerful technique to image the 3D structure of complex materials with nanometer resolution. Both, TEM and HAADF-STEM tomography exhibit tremendous possibilities to visualize nanostructured materials for a wide range of applications. Electron tomography is not only a qualitative tool to visualize nano¬structures, but recently electron tomographic results are also exploited to obtain quantitative measurements in 3D. We evaluated the reconstruction and segmentation process for a heterogeneous catalyst and, in particular, tried to assess the reliability and accuracy of the quantification process. Furthermore, a quantitative analysis of electron tomographic results was compared to macroscopic measurements.
ISSN:0255-5476
1662-9752
1662-9752
DOI:10.4028/www.scientific.net/MSF.638-642.2517