Growth of (111) HgCdTe on (100) Si by MOVPE using metalorganic tellurium adsorption and annealing

(111)B CdTe layers free of antiphase domains and twins were directly grown on (100) Si 4°-misoriented toward substrates, using a metalorganic tellurium (Te) adsorption and annealing technique. Direct growth of (111)B CdTe on (100) Si has three major problems: the etching of Si by Te, antiphase domains, and twinning. Te adsorption at low temperature avoids the etching effect and annealing at a high temperature grows single domain CdTe layers. Te atoms on the Si surface are arranged in two stable positions, depending on annealing temperatures. We evaluated the characteristics of (111)B CdTe and (111)B HgCdTe layers. The full width at half maximum (FWHM) of the x-ray double crystal rocking curve (DCRC) showed 146 arc sec at the 8 µm thick CdTe layers. In Hg^sub 1-x^Cd^sub x^Te (x = 0.22 to 0.24) layers, the FWHMs of the DCRCs were 127 arc sec for a 7 µm thick layer and 119 arc sec for a 17 µm thick layer. The etch pit densities of the HgCdTe were 2.3 × 10^sup 6^ cm^sup -2^ at 7 µm and 1.5 × 10^sup 6^ cm^sup -2^ at 17 µm. [PUBLICATION ABSTRACT]