High-resolution spectrum of xenon ions at 13.4 nm

The spectrum of xenon excited in a low-inductance vacuum spark was photographed at high resolution in the region of 9.5-15.5 nm. The observed transitions were identified as belonging to ions from Xe8+ to Xe13+. In the region of importance for extreme-ultraviolet lithography around 13.4 nm, the stron...

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Veröffentlicht in:Optics letters 2003-08, Vol.28 (16), p.1478-1480
Hauptverfasser: Churilov, Sergei, Joshi, Yogi N, Reader, Joseph
Format: Artikel
Sprache:eng
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Zusammenfassung:The spectrum of xenon excited in a low-inductance vacuum spark was photographed at high resolution in the region of 9.5-15.5 nm. The observed transitions were identified as belonging to ions from Xe8+ to Xe13+. In the region of importance for extreme-ultraviolet lithography around 13.4 nm, the strongest lines were identified as 4d8-4d7 5p transitions in Xe10+. The identifications were made by use of energy parameters extrapolated along the isoelectronic sequence.
ISSN:0146-9592
1539-4794
DOI:10.1364/ol.28.001478