Standards for Which the Ellipsometric Parameter psi Remains Insensitive to Variations in the Angle of Incidence
We examine the possibility of using two- and three-phase systems suitable as standards for which the ellipsometric parameter ? remains insensitive to variations in the angle of incidence. These standards avoid propagation of errors in the angle of incidence with respect to the measured standard ? va...
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Veröffentlicht in: | Applied Optics 1998-09, Vol.37 (25), p.5912-5922 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We examine the possibility of using two- and three-phase systems suitable as standards for which the ellipsometric parameter ? remains insensitive to variations in the angle of incidence. These standards avoid propagation of errors in the angle of incidence with respect to the measured standard ? value. Different materials (dielectrics, metals, and semiconductors), adequate for the above purpose, are considered in different structure combinations, and their optical response are analyzed. |
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ISSN: | 1559-128X 0003-6935 1539-4522 |
DOI: | 10.1364/AO.37.005912 |