Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors

Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors

A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with r...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied Optics 1997-04, Vol.36 (10), p.2152-2156
Hauptverfasser: Ishii, M, Iwai, S, Ueki, T, Aoyagi, Y
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2156
container_issue 10
container_start_page 2152
container_title Applied Optics
container_volume 36
creator Ishii, M
Iwai, S
Ueki, T
Aoyagi, Y
description A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with reflectance wavelengths at 3.374 nm (C VI 1s-2p) and 3.950 nm (Ca XVIII 3d-5f) are successfully designed.
doi_str_mv 10.1364/ao.36.002152
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_734249313</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>734249313</sourcerecordid><originalsourceid>FETCH-LOGICAL-c354t-4694d28c2d7af7c7b153657fa337aaa2ebcf79d61ec4b5835da6a6bcf3ba8cae3</originalsourceid><addsrcrecordid>eNpFkM1Lw0AQxRdRbK3ePEtuXtya_UxyLMUvKBREQfCwbDYTG9lk626i5r83NRVP85j58Zj3EDon8Zwwya-1mzM5j2NKBD1AUyJYhrmg9HCnRYYJTV8m6CSE9zhmgmfJMZqQlApGUjFFr49QWjBt5Rr8pT_BQvPWbiLjmtY7G9XQblwRlc5HVvfgcd7jX_FHWCiib-x1H9WdbavxVlfeOx9O0VGpbYCz_Zyh59ubp-U9Xq3vHpaLFTbDPy3mMuMFTQ0tEl0mJsmHCFIkpWYs0VpTyE2ZZIUkYHguUiYKLbUclizXqdHAZuhy9N1699FBaFVdBQPW6gZcF1TCOOUZI2wgr0bSeBeCh1JtfVVr3ysSq12barFWTKqxzQG_2Bt3eQ3FP7yvj_0AFTdyjA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>734249313</pqid></control><display><type>article</type><title>Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors</title><source>Alma/SFX Local Collection</source><source>Optica Publishing Group Journals</source><creator>Ishii, M ; Iwai, S ; Ueki, T ; Aoyagi, Y</creator><creatorcontrib>Ishii, M ; Iwai, S ; Ueki, T ; Aoyagi, Y</creatorcontrib><description>A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with reflectance wavelengths at 3.374 nm (C VI 1s-2p) and 3.950 nm (Ca XVIII 3d-5f) are successfully designed.</description><identifier>ISSN: 1559-128X</identifier><identifier>ISSN: 0003-6935</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/ao.36.002152</identifier><identifier>PMID: 18253185</identifier><language>eng</language><publisher>United States</publisher><ispartof>Applied Optics, 1997-04, Vol.36 (10), p.2152-2156</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c354t-4694d28c2d7af7c7b153657fa337aaa2ebcf79d61ec4b5835da6a6bcf3ba8cae3</citedby><cites>FETCH-LOGICAL-c354t-4694d28c2d7af7c7b153657fa337aaa2ebcf79d61ec4b5835da6a6bcf3ba8cae3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/18253185$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Ishii, M</creatorcontrib><creatorcontrib>Iwai, S</creatorcontrib><creatorcontrib>Ueki, T</creatorcontrib><creatorcontrib>Aoyagi, Y</creatorcontrib><title>Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors</title><title>Applied Optics</title><addtitle>Appl Opt</addtitle><description>A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with reflectance wavelengths at 3.374 nm (C VI 1s-2p) and 3.950 nm (Ca XVIII 3d-5f) are successfully designed.</description><issn>1559-128X</issn><issn>0003-6935</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNpFkM1Lw0AQxRdRbK3ePEtuXtya_UxyLMUvKBREQfCwbDYTG9lk626i5r83NRVP85j58Zj3EDon8Zwwya-1mzM5j2NKBD1AUyJYhrmg9HCnRYYJTV8m6CSE9zhmgmfJMZqQlApGUjFFr49QWjBt5Rr8pT_BQvPWbiLjmtY7G9XQblwRlc5HVvfgcd7jX_FHWCiib-x1H9WdbavxVlfeOx9O0VGpbYCz_Zyh59ubp-U9Xq3vHpaLFTbDPy3mMuMFTQ0tEl0mJsmHCFIkpWYs0VpTyE2ZZIUkYHguUiYKLbUclizXqdHAZuhy9N1699FBaFVdBQPW6gZcF1TCOOUZI2wgr0bSeBeCh1JtfVVr3ysSq12barFWTKqxzQG_2Bt3eQ3FP7yvj_0AFTdyjA</recordid><startdate>19970401</startdate><enddate>19970401</enddate><creator>Ishii, M</creator><creator>Iwai, S</creator><creator>Ueki, T</creator><creator>Aoyagi, Y</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>19970401</creationdate><title>Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors</title><author>Ishii, M ; Iwai, S ; Ueki, T ; Aoyagi, Y</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c354t-4694d28c2d7af7c7b153657fa337aaa2ebcf79d61ec4b5835da6a6bcf3ba8cae3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ishii, M</creatorcontrib><creatorcontrib>Iwai, S</creatorcontrib><creatorcontrib>Ueki, T</creatorcontrib><creatorcontrib>Aoyagi, Y</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Applied Optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ishii, M</au><au>Iwai, S</au><au>Ueki, T</au><au>Aoyagi, Y</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors</atitle><jtitle>Applied Optics</jtitle><addtitle>Appl Opt</addtitle><date>1997-04-01</date><risdate>1997</risdate><volume>36</volume><issue>10</issue><spage>2152</spage><epage>2156</epage><pages>2152-2156</pages><issn>1559-128X</issn><issn>0003-6935</issn><eissn>1539-4522</eissn><abstract>A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with reflectance wavelengths at 3.374 nm (C VI 1s-2p) and 3.950 nm (Ca XVIII 3d-5f) are successfully designed.</abstract><cop>United States</cop><pmid>18253185</pmid><doi>10.1364/ao.36.002152</doi><tpages>5</tpages></addata></record>
fulltext fulltext
identifier ISSN: 1559-128X
ispartof Applied Optics, 1997-04, Vol.36 (10), p.2152-2156
issn 1559-128X
0003-6935
1539-4522
language eng
recordid cdi_proquest_miscellaneous_734249313
source Alma/SFX Local Collection; Optica Publishing Group Journals
title Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T18%3A19%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reflection-wavelength%20control%20method%20for%20layer-by-layer%20controlled%20x-ray%20multilayer%20mirrors&rft.jtitle=Applied%20Optics&rft.au=Ishii,%20M&rft.date=1997-04-01&rft.volume=36&rft.issue=10&rft.spage=2152&rft.epage=2156&rft.pages=2152-2156&rft.issn=1559-128X&rft.eissn=1539-4522&rft_id=info:doi/10.1364/ao.36.002152&rft_dat=%3Cproquest_cross%3E734249313%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=734249313&rft_id=info:pmid/18253185&rfr_iscdi=true