Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors
A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with r...
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| Veröffentlicht in: | Applied Optics 1997-04, Vol.36 (10), p.2152-2156 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | A reflection-wavelength control method for a layer-by-layer controlled x-ray multilayer mirror without interface roughness is proposed. The reflection wavelength of the multiperiodic mirror is found to be simply determined by a combination ratio of periodic layers. Multiperiodic x-ray mirrors with reflectance wavelengths at 3.374 nm (C VI 1s-2p) and 3.950 nm (Ca XVIII 3d-5f) are successfully designed. |
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| ISSN: | 1559-128X 0003-6935 1539-4522 |
| DOI: | 10.1364/ao.36.002152 |