$Multiple scattering correction in the measurement of particle size and number density by the diffraction method$

Multiple scattering correction in the measurement of particle size and number density by the diffraction method

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Bibliographische Detailangaben
Veröffentlicht in:	Applied Optics 1986-10, Vol.25 (19), p.3552-3558
1. Verfasser:	GOMI, H
Format:	Artikel
Sprache:	eng
Schlagworte:	Exact sciences and technology Measurements common to several branches of physics and astronomy Metrology, measurements and laboratory procedures Physics Spatial dimensions (e.g.: position, lengths, volume, angles, displacements, including nanometer-scale displacements)
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