Fractional Talbot imaging of phase gratings with hard x rays

Fractional Talbot images of optical gratings acting as periodic phase objects have been obtained by use of x rays of 0.069-nm wavelength from a third-generation synchrotron radiation source. Quantitative evaluation of the data obtained as a function of defocusing distance provides information on the lateral coherence of the beam as well as on the phase modulation in the object.