Crystallographic preferred orientation (CPO) of gypsum measured by electron backscatter diffraction (EBSD)
An investigation by electron backscatter diffraction on gypsum shows that this technique can be used to study the microstructures and crystallographic preferred orientation of gypsum. Presented here are the methods, verification tests and data obtained from a naturally deformed sample of gypsum-rich...
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Veröffentlicht in: | Journal of microscopy (Oxford) 2009-12, Vol.236 (3), p.159-164 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | An investigation by electron backscatter diffraction on gypsum shows that this technique can be used to study the microstructures and crystallographic preferred orientation of gypsum. Presented here are the methods, verification tests and data obtained from a naturally deformed sample of gypsum-rich rock. The electron backscatter diffraction data show the sample has a strong crystallographic preferred orientation. |
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ISSN: | 0022-2720 1365-2818 |
DOI: | 10.1111/j.1365-2818.2009.03292.x |