Measurement of 248-nm, subpicosecond pulse durations by two-photon fluorescence of xenon excimers

A technique for measuring the duration of single ultrashort pulses at KrF(*) wavelengths has been developed that employs fluorescence from xenon excimers excited by two-photon absorption of atom pairs. Pulses of ~350-fsec duration have been measured at 248 nm.

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Bibliographische Detailangaben
Veröffentlicht in:	Opt. Lett.; (United States) 1987-02, Vol.12 (2), p.102-104
Hauptverfasser:	HUTCHINSON, M. H. R, MCINTYRE, I. A, GIBSON, G. N, RHODES, C. K
Format:	Artikel
Sprache:	eng
Schlagworte:	420300 - Engineering- Lasers- (-1989) CHEMICAL REACTION KINETICS ELECTROMAGNETIC RADIATION ENERGY LEVELS ENGINEERING Exact sciences and technology EXCIMER LASERS FLUORESCENCE FLUORIDES FLUORINE COMPOUNDS Fundamental areas of phenomenology (including applications) GAS LASERS Gas lasers including excimer and metal-vapor lasers HALIDES HALOGEN COMPOUNDS KINETICS KRYPTON COMPOUNDS KRYPTON FLUORIDES LASER RADIATION LASERS LUMINESCENCE MULTI-PHOTON PROCESSES Optics PERFORMANCE TESTING Physics PULSES RADIATIONS RARE GAS COMPOUNDS REACTION KINETICS RELIABILITY RESOLUTION TESTING XENON COMPOUNDS XENON FLUORIDES
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Beschreibung
Zusammenfassung:	A technique for measuring the duration of single ultrashort pulses at KrF(*) wavelengths has been developed that employs fluorescence from xenon excimers excited by two-photon absorption of atom pairs. Pulses of ~350-fsec duration have been measured at 248 nm.
ISSN:	0146-9592 1539-4794
DOI:	10.1364/ol.12.000102