Absolute reflectometer for the 0.8-2.5-microm region

Absolute reflectometer for the 0.8-2.5-microm region

A reflectometer based on an integrating sphere operating in the 0.8-2.5-microm region is described. The reflectometer is of the absolute type and does not need a standard diffuse reflecting surface to obtain absolute reflectance values. The system is fully automatic, using computer-controlled circul...

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Veröffentlicht in:Applied optics (2004) 1987-02, Vol.26 (3), p.583-586
Hauptverfasser: Sheffer, D, Oppenheim, U P, Clement, D, Devir, A D
Format: Artikel
Sprache:eng
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Zusammenfassung:A reflectometer based on an integrating sphere operating in the 0.8-2.5-microm region is described. The reflectometer is of the absolute type and does not need a standard diffuse reflecting surface to obtain absolute reflectance values. The system is fully automatic, using computer-controlled circular variable filters as monochromators. Results for BaSO(4) in the region between the visible and 2.5 microm show considerable deviations from the accepted values of reflectivity for this substance.
ISSN:1559-128X
DOI:10.1364/AO.26.000583