Calibration of AFM cantilever spring constants

In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Young's modulus, density of the cantilever and resonant frequency. The thickness of...

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Veröffentlicht in:	Ultramicroscopy 2003-10, Vol.97 (1), p.113-118
Hauptverfasser:	Gibson, Christopher T., Weeks, Brandon L., Abell, Chris, Rayment, Trevor, Myhra, Sverre
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopes Cantilever Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Q-factor Resonant frequency and spring constant Scanning probe microscopes, components and techniques
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