Calibration of AFM cantilever spring constants
In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Young's modulus, density of the cantilever and resonant frequency. The thickness of...
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| Veröffentlicht in: | Ultramicroscopy 2003-10, Vol.97 (1), p.113-118 |
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| container_title | Ultramicroscopy |
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| creator | Gibson, Christopher T. Weeks, Brandon L. Abell, Chris Rayment, Trevor Myhra, Sverre |
| description | In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Young's modulus, density of the cantilever and resonant frequency. The thickness of thin gold layers was determined by measuring changes in the resonant frequency and Q-factor of beam shaped AFM cantilevers before and after coating.
The techniques for measuring the spring constant and thin film thickness provide accuracy on the order of 10–15%. |
| doi_str_mv | 10.1016/S0304-3991(03)00035-4 |
| format | Article |
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The techniques for measuring the spring constant and thin film thickness provide accuracy on the order of 10–15%.</description><subject>Atomic force microscopes</subject><subject>Cantilever</subject><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Physics</subject><subject>Q-factor</subject><subject>Resonant frequency and spring constant</subject><subject>Scanning probe microscopes, components and techniques</subject><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNqFkM1LwzAUwIMobk7_BKUXRQ-d-WqbnGQMp8LEg3oOafoika6dSTfwvzfdhjvu8h48fu_rh9AlwWOCSX7_jhnmKZOS3GJ2hzFmWcqP0JCIQqa0oOwYDf-RAToL4TtCBHNxigaEijgjZ0M0nuralV53rm2S1iaT2WtidNO5Gtbgk7D0rvlKTNuELlbDOTqxug5wscsj9Dl7_Jg-p_O3p5fpZJ4aLkSXlpJUggIFXRrJpOBWZ5ADzokFWmoCJRTW8E2RF7mNkWMmhCyZyUtK2AjdbOcuffuzgtCphQsG6lo30K6CKhiTGc74QZAWAhc0lxHMtqDxbQgerIqvLbT_VQSr3qjaGFW9LoWZ2hhV_YKr3YJVuYBq37VTGIHrHaCD0bX1ujEu7LkohGZ5_9LDloPobe3Aq2AcNAYq58F0qmrdgVP-ANz0kUA</recordid><startdate>20031001</startdate><enddate>20031001</enddate><creator>Gibson, Christopher T.</creator><creator>Weeks, Brandon L.</creator><creator>Abell, Chris</creator><creator>Rayment, Trevor</creator><creator>Myhra, Sverre</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>7X8</scope></search><sort><creationdate>20031001</creationdate><title>Calibration of AFM cantilever spring constants</title><author>Gibson, Christopher T. ; Weeks, Brandon L. ; Abell, Chris ; Rayment, Trevor ; Myhra, Sverre</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c488t-b91d82e2eabc93984fa5e6e061fe2ba1ebe7fc4a5e6e476f6e4403889b3c6b213</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Atomic force microscopes</topic><topic>Cantilever</topic><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Physics</topic><topic>Q-factor</topic><topic>Resonant frequency and spring constant</topic><topic>Scanning probe microscopes, components and techniques</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gibson, Christopher T.</creatorcontrib><creatorcontrib>Weeks, Brandon L.</creatorcontrib><creatorcontrib>Abell, Chris</creatorcontrib><creatorcontrib>Rayment, Trevor</creatorcontrib><creatorcontrib>Myhra, Sverre</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>MEDLINE - Academic</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gibson, Christopher T.</au><au>Weeks, Brandon L.</au><au>Abell, Chris</au><au>Rayment, Trevor</au><au>Myhra, Sverre</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Calibration of AFM cantilever spring constants</atitle><jtitle>Ultramicroscopy</jtitle><addtitle>Ultramicroscopy</addtitle><date>2003-10-01</date><risdate>2003</risdate><volume>97</volume><issue>1</issue><spage>113</spage><epage>118</epage><pages>113-118</pages><issn>0304-3991</issn><eissn>1879-2723</eissn><coden>ULTRD6</coden><abstract>In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Young's modulus, density of the cantilever and resonant frequency. The thickness of thin gold layers was determined by measuring changes in the resonant frequency and Q-factor of beam shaped AFM cantilevers before and after coating.
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| language | eng |
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| subjects | Atomic force microscopes Cantilever Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Q-factor Resonant frequency and spring constant Scanning probe microscopes, components and techniques |
| title | Calibration of AFM cantilever spring constants |
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