Simultaneous multielement atomic-emission spectrometry with a charge-injection device detector

Simultaneous multielement atomic-emission spectrometry with a charge-inection device (CID) as a multichannel optical detector is described. The system used in this study employs a standard commercial D.C. plasma source, a modified echelle spectrometer, and a special digital camera system that uses a two-dimensional CID array sensor. A description of the modified spectrometer is given along with performance results. Computer algorithms for acquiring and analysing spectral information are described. Detection limits for several elements are determined simultaneously. Results of simultaneous determination of several elements in an NBS standard reference material (SRM 1643A) are given. These results indicate that the CID detector is capable of reasonably good accuracy and high sensitivity in the simultaneous determination of several elements in complex samples.