Microwave-induced plasma coupled to a tantalum-strip vaporization assembly for trace element analysis

This report describes a tantalum-strip assembly coupled to a microwave-induced plasma. Detection limits obtained for several elements by using the apparatus are given. A procedure using bomb decomposition and chelate extraction in conjunction with the tantalum-strip assembly/microwave-induced plasma system for the determination of trace elements in samples with complex matrices is also described. Recoveries from spiked standards are given.