Highly Uniform 300 mm Wafer-Scale Deposition of Single and Multilayered Chemically Derived Graphene Thin Films

The deposition of atomically thin highly uniform chemically derived graphene (CDG) films on 300 mm SiO2/Si wafers is reported. We demonstrate that the very thin films can be lifted off to form uniform membranes that can be free-standing or transferred onto any substrate. Detailed maps of thickness u...

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Veröffentlicht in:ACS nano 2010-01, Vol.4 (1), p.524-528
Hauptverfasser: Yamaguchi, Hisato, Eda, Goki, Mattevi, Cecilia, Kim, HoKwon, Chhowalla, Manish
Format: Artikel
Sprache:eng
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Zusammenfassung:The deposition of atomically thin highly uniform chemically derived graphene (CDG) films on 300 mm SiO2/Si wafers is reported. We demonstrate that the very thin films can be lifted off to form uniform membranes that can be free-standing or transferred onto any substrate. Detailed maps of thickness using Raman spectroscopy and atomic force microscopy height profiles reveal that the film thickness is very uniform and highly controllable, ranging from 1−2 layers up to 30 layers. After reduction using a variety of methods, the CDG films are transparent and electrically active with FET devices yielding high mobilities of ∼15 cm2/(V s) and sheet resistance of ∼1 kΩ/sq at ∼70% transparency.
ISSN:1936-0851
1936-086X
DOI:10.1021/nn901496p