New difference reflectance methods for study of small interfacial effects

Two sensitive differential optical techniques useful for study of small reflectance or absorptive differences between two interfaces are described. The first scheme employs a mechanically chopped light beam impinging on an arrangement of symmetrical dual cells to allow detection of differential refl...

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Veröffentlicht in:	Rev. Sci. Instrum.; (United States) 1979-04, Vol.50 (4), p.438-441
Hauptverfasser:	Huber, Edward D., Sari, S. O.
Format:	Artikel
Sprache:	eng
Schlagworte:	440300 - Miscellaneous Instruments- (-1989) ALKALI METAL COMPOUNDS AMPLIFIERS ELECTROMAGNETIC RADIATION ELECTRONIC EQUIPMENT ELEMENTS HYDROGEN COMPOUNDS HYDROXIDES INFRARED RADIATION INTERFACES LASERS MEASURING INSTRUMENTS METALS MONOCHROMATORS NEAR INFRARED RADIATION NEAR ULTRAVIOLET RADIATION NONMETALS OPTICAL PROPERTIES OPTICAL SPECTROMETERS OTHER INSTRUMENTATION OXYGEN COMPOUNDS PHOTOMULTIPLIERS PHOTOTUBES PHYSICAL PROPERTIES POLARIZATION POTASSIUM COMPOUNDS POTASSIUM HYDROXIDES RADIATIONS RARE GASES REFLECTIVITY SILVER SPECTROMETERS SURFACE PROPERTIES TRANSITION ELEMENTS ULTRAVIOLET RADIATION VISIBLE RADIATION XENON
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Beschreibung
Zusammenfassung:	Two sensitive differential optical techniques useful for study of small reflectance or absorptive differences between two interfaces are described. The first scheme employs a mechanically chopped light beam impinging on an arrangement of symmetrical dual cells to allow detection of differential reflectances ΔR/R
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.1135846