Electronic channel fringe holography for depth and delay measurements

Electronic channel fringe holography for depth and delay measurements

Electronic spectral holography in the form developed by Shih [Ph.D. dissertation, University Microfilms, Ann Arbor, Mich. (1995)] is adapted to various applications, including optical coherence tomography in scattering media, contouring of surfaces, and optical fiber mode examination.

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Veröffentlicht in:Applied Optics 1999-04, Vol.38 (11), p.2196-2203, Article 2196
Hauptverfasser: Iglesias, I, Chen, H S, Mills, K D, Dilworth, D S, Leith, E N
Format: Artikel
Sprache:eng
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Zusammenfassung:Electronic spectral holography in the form developed by Shih [Ph.D. dissertation, University Microfilms, Ann Arbor, Mich. (1995)] is adapted to various applications, including optical coherence tomography in scattering media, contouring of surfaces, and optical fiber mode examination.
ISSN:0003-6935
1559-128X
1539-4522
DOI:10.1364/AO.38.002196