Optical characterization of grating surface emitting semiconductor lasers

Optical characterization of grating surface emitting semiconductor lasers

We describe an apparatus for measuring the optical characteristics of grating coupled surface emitting semiconductor lasers. These measurements include far and near field measurements, spectrum, and total power. The far field can be determined with an absolute accuracy of 0.01 degrees .

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Bibliographische Detailangaben
Veröffentlicht in:Applied Optics 1990-06, Vol.29 (18), p.2718-2721
1. Verfasser: WAARTS, R. G
Format: Artikel
Sprache:eng
Schlagworte:
426002 - Engineering- Lasers & Masers- (1990-)
Charged-particle beams
Electromagnetism
electron and ion optics
EMISSION SPECTRA
ENGINEERING
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
GRATINGS
LASERS
PHASE STABILITY
Physics
POWER
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SOLID STATE LASERS
SPECTRA
STABILITY
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Beschreibung
Zusammenfassung:We describe an apparatus for measuring the optical characteristics of grating coupled surface emitting semiconductor lasers. These measurements include far and near field measurements, spectrum, and total power. The far field can be determined with an absolute accuracy of 0.01 degrees .
ISSN:0003-6935
1559-128X
1539-4522
DOI:10.1364/AO.29.002718