Evidence for inhibited diffraction of light propagating through nanolaminate metallodielectric material
We report the fabrication and characterization of laterally continuous silver layers alternated with glassy amorphous polycarbonate films with the thickness of each layer much less than the wavelength. Such films exhibit physical phenomena associated with the coupled plasmon resonances. We have char...
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Veröffentlicht in: | Optics express 2007-09, Vol.15 (19), p.11999-12004 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We report the fabrication and characterization of laterally continuous silver layers alternated with glassy amorphous polycarbonate films with the thickness of each layer much less than the wavelength. Such films exhibit physical phenomena associated with the coupled plasmon resonances. We have characterized light propagation through the resulting metal-dielectric (MD) periodic structures using collection mode Near Field Scanning Optical Microscopy (NSOM). In agreement with published theoretical models, our experiments provide evidence that diffraction can be inhibited for light propagating through metallodielectric nanolaminate. |
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ISSN: | 1094-4087 1094-4087 |
DOI: | 10.1364/OE.15.011999 |