Preparation of high laser induced damage threshold antireflection film using interrupted ion assisted deposition

Single layers and antireflection films were deposited by electron beam evaporation, ion assisted deposition and interrupted ion assisted deposition, respectively. Antireflection film of quite high laser damage threshold (18J/cm2) deposited by interrupted ion assisted deposition were got. The electri...

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Veröffentlicht in:Optics express 2007-08, Vol.15 (17), p.10753-10760
Hauptverfasser: Zhang, Da-Wei, Huang, Yuan-Shen, Ni, Zheng-Ji, Zhuang, Song-Lin, Shao, Jian-Da, Fan, Zheng-Xiu
Format: Artikel
Sprache:eng
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Zusammenfassung:Single layers and antireflection films were deposited by electron beam evaporation, ion assisted deposition and interrupted ion assisted deposition, respectively. Antireflection film of quite high laser damage threshold (18J/cm2) deposited by interrupted ion assisted deposition were got. The electric field distribution, weak absorption, and residual stress of films and their relations to damage threshold were investigated. It was shown that the laser induced damage threshold of film was the result of competition of disadvantages and advantages, and interrupted ion assisted deposition was one of the valuable methods for preparing high laser induced damage threshold films.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.15.010753