Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses

Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses

The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdS(x)Se(1-x). Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.

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Veröffentlicht in:Applied Optics 1988-05, Vol.27 (9), p.1811-1813
Hauptverfasser: Bertolotti, M, Ferrari, A, Sibilia, C, Suber, G, Apostol, D, Jani, P
Format: Artikel
Sprache:eng
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Zusammenfassung:The photothermal deflection technique is used to determine the thermal nonlinearity in samples of glasses doped with CdS(x)Se(1-x). Values of the nonlinear refractive index are derived at low frequencies; they compare with recently obtained dc values in similar, but not equal, glasses.
ISSN:1559-128X
0003-6935
1539-4522
DOI:10.1364/AO.27.001811