High refractive index chalcogenide glass for photonic crystal applications

A high refractive index Te-enriched bulk chalcogenide glass Ge(20)As(20)Se(14)Te(46) (n approximately 3.3) has been patterned by ablation using four- and two-beam interference femto-second laser setups operating at 800 nm. The regular arrays of 0.8 mum diameter and more than 0.8 mum depth holes and/...

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Veröffentlicht in:Optics express 2007-03, Vol.15 (5), p.2336-2340
Hauptverfasser: Paivasaari, Kimmo, Tikhomirov, Victor K, Turunen, Jari
Format: Artikel
Sprache:eng
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Zusammenfassung:A high refractive index Te-enriched bulk chalcogenide glass Ge(20)As(20)Se(14)Te(46) (n approximately 3.3) has been patterned by ablation using four- and two-beam interference femto-second laser setups operating at 800 nm. The regular arrays of 0.8 mum diameter and more than 0.8 mum depth holes and/or grooves of typical size of 1x1 mm(2) have been written on the surface of the glass in a time-scale of 1 second with 50 femtosecond pulses. The high photosensitivity of this narrow-gap semiconductor glass to the femtosecond irradiation is ascribed to a free electron absorption typical of metals, which is caused by laser-induced heating of the glass.
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.15.002336