Optical absorption of surfaces modified by carbon filaments

The reflectivities of modified carbon, silicon, and quartz surfaces have been measured from 1 to 25-microm wavelengths. Surfaces were modified by either bombarding carbon surfaces with ~1000-eV Ar(+) ions or growing carbon filaments on them by catalytic chemical vapor deposition from hydrocarbon/hyd...

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Veröffentlicht in:Applied Optics 1987-11, Vol.26 (21), p.4625-4631
Hauptverfasser: BOWERS, C. W, CULVER, R. B, SOLBERG, W. A, SPAIN, I. L
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Sprache:eng
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Zusammenfassung:The reflectivities of modified carbon, silicon, and quartz surfaces have been measured from 1 to 25-microm wavelengths. Surfaces were modified by either bombarding carbon surfaces with ~1000-eV Ar(+) ions or growing carbon filaments on them by catalytic chemical vapor deposition from hydrocarbon/hydrogen mixtures. The surfaces were highly absorbing through most of this wavelength region with most surfaces showing a rise in reflectivity beyond ~15 microm. The reflectivity of one modified Si surface was below 1% throughout the entire wavelength region and may be the most highly absorbing surface yet found.
ISSN:0003-6935
1559-128X
1539-4522
DOI:10.1364/AO.26.004625