Measurement of the refractive-index profile in polycrystalline germanium-silicon alloy GRIN crystals

Measurement of the refractive-index profile in polycrystalline germanium-silicon alloy GRIN crystals

The refractive index as a function of spatial coordinate in three Czochralski grown germanium-silicon alloy GRIN crystals has been measured using ac interferometric techniques. The interferometer is capable of high phase resolution and is computer controlled for real-time data processing. The measur...

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Veröffentlicht in:Applied Optics 1988-02, Vol.27 (3), p.505-507
Hauptverfasser: NAUGHTON, D. P, MICELI, J. J. JR, MOORE, D. T
Format: Artikel
Sprache:eng
Schlagworte:
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Optical materials
Optics
Physics
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Zusammenfassung:The refractive index as a function of spatial coordinate in three Czochralski grown germanium-silicon alloy GRIN crystals has been measured using ac interferometric techniques. The interferometer is capable of high phase resolution and is computer controlled for real-time data processing. The measured refractive-index profiles were compared to theoretical profiles which were calculated from a model based on the segregation effect of silicon in germanium.
ISSN:0003-6935
1559-128X
1539-4522
DOI:10.1364/AO.27.000505