Characterization of silicon nanowire by use of full-vectorial finite element method

We have carried out a rigorous H-field-based full-vectorial modal analysis and used it to characterize, more accurately, the abrupt dielectric discontinuity of a high index contrast optical waveguide. The full-vectorial H and E fields and the Poynting vector profiles are described in detail. It has...

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Veröffentlicht in:	Applied Optics 2010-06, Vol.49 (16), p.3173-3181
Hauptverfasser:	Kejalakshmy, N, Agrawal, Arti, Aden, Yasin, Leung, D M H, Rahman, B M A, Grattan, K T V
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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