Atomic force microscopy probes go electrochemical

Gardner and Macpherson describe developments in Scanned probe microspray methodology that combine electronchemical and atomic force microscopy, probes, devices that were previously used only in isolation.

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Analytical chemistry (Washington) 2002-11, Vol.74 (21), p.576A-584A
Hauptverfasser:	Gardner, Catherine E, Macpherson, Julie V
Format:	Artikel
Sprache:	eng
Schlagworte:	Atoms & subatomic particles Chemistry Electrochemistry - methods Microscopy, Atomic Force - methods Microscopy, Atomic Force - trends Nanotechnology Scientific imaging
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Gardner and Macpherson describe developments in Scanned probe microspray methodology that combine electronchemical and atomic force microscopy, probes, devices that were previously used only in isolation.
ISSN:	0003-2700 1520-6882
DOI:	10.1021/ac0221482