Effect of Bond-Length Alternation in Molecular Wires

Effect of Bond-Length Alternation in Molecular Wires

Current−voltage (I−V) characteristics for metal−molecule−metal junctions formed from three classes of molecules measured with a simple crossed-wire molecular electronics test-bed are reported. Junction conductance as a function of molecular structure is consistent with I−V characteristics calculated...

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Veröffentlicht in:Journal of the American Chemical Society 2002-09, Vol.124 (36), p.10654-10655
Hauptverfasser: Kushmerick, James G, Holt, David B, Pollack, Steven K, Ratner, Mark A, Yang, John C, Schull, Terence L, Naciri, Jawad, Moore, Martin H, Shashidhar, Ranganathan
Format: Artikel
Sprache:eng
Schlagworte:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electrical properties of specific thin films
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Exact sciences and technology
Physics
Polymers
organic compounds
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Zusammenfassung:Current−voltage (I−V) characteristics for metal−molecule−metal junctions formed from three classes of molecules measured with a simple crossed-wire molecular electronics test-bed are reported. Junction conductance as a function of molecular structure is consistent with I−V characteristics calculated from extended Hückel theory coupled with a Green's function approach, and can be understood on the basis of bond-length alternation.
ISSN:0002-7863
1520-5126
DOI:10.1021/ja027090n