Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals

We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measure...

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Veröffentlicht in:	Optics express 2008-04, Vol.16 (8), p.5453-5464
Hauptverfasser:	Descrovi, Emiliano, Sfez, Tristan, Dominici, Lorenzo, Nakagawa, Wataru, Michelotti, Francesco, Giorgis, Fabrizio, Herzig, Hans-Peter
Format:	Artikel
Sprache:	eng
Schlagworte:	Computer Simulation Computer-Aided Design Crystallization - methods Equipment Design Equipment Failure Analysis Microscopy, Scanning Tunneling - methods Models, Theoretical Optics and Photonics - instrumentation Photons Silicon Compounds - chemistry
Online-Zugang:	Volltext
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