Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals

We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measure...

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Veröffentlicht in:Optics express 2008-04, Vol.16 (8), p.5453-5464
Hauptverfasser: Descrovi, Emiliano, Sfez, Tristan, Dominici, Lorenzo, Nakagawa, Wataru, Michelotti, Francesco, Giorgis, Fabrizio, Herzig, Hans-Peter
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Sprache:eng
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Zusammenfassung:We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a approximately 10(2) near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.16.005453