Photoinduced dehydrogenation of defects in undoped a-si:H using positron annihilation spectroscopy

We report changes in variable-energy positron annihilation spectroscopy measurements on undoped hydrogenated amorphous silicon films after light soaking. The change, seen predominantly in the high momentum band of the annihilation radiation, is not reversed by thermal annealing. We suggest, followin...

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Veröffentlicht in:Physical review letters 2000-01, Vol.84 (4), p.769-772
Hauptverfasser: Zou, X, Chan, Y C, Webb, D P, Lam, Y W, Hu, Y F, Beling, C D, Fung, S, Weng, H M
Format: Artikel
Sprache:eng
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Zusammenfassung:We report changes in variable-energy positron annihilation spectroscopy measurements on undoped hydrogenated amorphous silicon films after light soaking. The change, seen predominantly in the high momentum band of the annihilation radiation, is not reversed by thermal annealing. We suggest, following recent models of the Staebler-Wronski effect, that light exposure induces hydrogen trapped in vacancylike defects to become mobile in the Si network. The observations place constraints on models of hydrogen motion fitting macroscopic Staebler-Wronski effect kinetics and may help to achieve a definitive description of metastability in a-Si:H.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.84.769