Dynamic speckle illumination microscopy with wavelet prefiltering

Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The r...

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Veröffentlicht in:Optics letters 2007-06, Vol.32 (11), p.1417-1419
Hauptverfasser: VENTALON, Cathie, HEINTZMANN, Rainer, MERTZ, Jerome
Format: Artikel
Sprache:eng
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Zusammenfassung:Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.32.001417