Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

Using a fifth-order aberration-corrected scanning transmission electron microscope, which provides a factor of 100 increase in signal over an uncorrected instrument, we demonstrated two-dimensional elemental and valence-sensitive imaging at atomic resolution by means of electron energy-loss spectros...

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Veröffentlicht in:Science (American Association for the Advancement of Science) 2008-02, Vol.319 (5866), p.1073-1076
Hauptverfasser: Muller, D.A, Kourkoutis, L. Fitting, Murfitt, M, Song, J.H, Hwang, H.Y, Silcox, J, Dellby, N, Krivanek, O.L
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Sprache:eng
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Zusammenfassung:Using a fifth-order aberration-corrected scanning transmission electron microscope, which provides a factor of 100 increase in signal over an uncorrected instrument, we demonstrated two-dimensional elemental and valence-sensitive imaging at atomic resolution by means of electron energy-loss spectroscopy, with acquisition times of well under a minute (for a 4096-pixel image). Applying this method to the study of a La₀.₇Sr₀.₃MnO₃/SrTiO₃ multilayer, we found an asymmetry between the chemical intermixing on the manganese-titanium and lanthanum-strontium sublattices. The measured changes in the titanium bonding as the local environment changed allowed us to distinguish chemical interdiffusion from imaging artifacts.
ISSN:0036-8075
1095-9203
DOI:10.1126/science.1148820