Photon statistics of semiconductor microcavity lasers

We present measurements of first- and second-order coherence of quantum-dot micropillar lasers together with a semiconductor laser theory. Our results show a broad threshold region for the observed high-beta microcavities. The intensity jump is accompanied by both pronounced photon intensity fluctua...

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Veröffentlicht in:Physical review letters 2007-01, Vol.98 (4), p.043906-043906, Article 043906
Hauptverfasser: Ulrich, S M, Gies, C, Ates, S, Wiersig, J, Reitzenstein, S, Hofmann, C, Löffler, A, Forchel, A, Jahnke, F, Michler, P
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Sprache:eng
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Zusammenfassung:We present measurements of first- and second-order coherence of quantum-dot micropillar lasers together with a semiconductor laser theory. Our results show a broad threshold region for the observed high-beta microcavities. The intensity jump is accompanied by both pronounced photon intensity fluctuations and strong coherence length changes. The investigations clearly visualize a smooth transition from spontaneous to predominantly stimulated emission which becomes harder to determine for high beta. In our theory, a microscopic approach is used to incorporate the semiconductor nature of quantum dots. The results are in agreement with the experimental intensity traces and the photon statistics measurements.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.98.043906