Characterization of Langmuir–Blodgett organoclay films using X-ray reflectivity and atomic force microscopy

Monolayers of organoclay platelets were formed at the air/water interface using the Langmuir technique and were then investigated either by in situ or lifted onto Si wafers and studied ex situ, using X-ray reflectivity (XR) methods. The XR data showed that the surfactant molecules on the clay platelets formed a dense, self-assembled monolayer where the molecules were tilted at an angle of 35 ° ± 6 ° from the normal to the dry clay surface. The surfactant layers only covered a fraction of the clay platelet surface area, where the fractional surface coverage for the three clays studied (C6A, C15A, and C20A) was found to be 0.90, 0.86, and 0.73, respectively. These values were significantly higher than those estimated from the cation exchange capacity (CEC) values. Rather than being uniformly distributed, the surfactant was clustered in patchy regions, indicating that the surface of the clay platelets had both polar and non-polar segments. This heterogeneity confirmed the hypothesis which was previously invoked to explain the distribution of the clay platelets in melt mixed homopolymer and polymer blend nanocomposites. Using the LB method, monolayer films of various commercial montmorillonite clays were formed at the air/water interface, and X-ray reflectivity measurements were performed both at the air/water interface and after lifting the films off the surface onto silicon wafers. These results were further compared with atomic force microscopy results.