A Novel High-Gradient Permanent Magnet for the Profiling of Planar Films and Coatings

The design and construction of a low-cost, permanent magnet is described. The magnet is intended for applications which require a large static gradient, such as those for which stray field imaging or fringe field diffusometry are conventionally employed. The magnet has been designed using the scalar...

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Veröffentlicht in:Journal of magnetic resonance (1997) 1999-07, Vol.139 (1), p.90-97
Hauptverfasser: Glover, P.M., Aptaker, P.S., Bowler, J.R., Ciampi, E., McDonald, P.J.
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Sprache:eng
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Zusammenfassung:The design and construction of a low-cost, permanent magnet is described. The magnet is intended for applications which require a large static gradient, such as those for which stray field imaging or fringe field diffusometry are conventionally employed. The magnet has been designed using the scalar potential method. Particular features of the magnet include a field profile such that ‖B‖ is constant in the horizontal plane and such that B is horizontal at the midpoint between the poles. There is a vertical, and therefore orthogonal, strong gradient, G, in ‖B‖. The ratio G/‖B‖ is constant within a large volume and so allows measurements at a range of gradient strengths. It is this ratio which governs the shape of the pole-pieces. The constructed magnet has a typical operating field of 0.8 T, gives a gradient of 20 Tm−1, and has a useable interpole access of 20 mm. Field plot data show values consistent with the theory. In particular ‖B‖ has a curvature of less than ±5 μm over a 5 × 5 mm area at the target field. The magnet is most suitable for the one-dimensional profiling of thin planar samples. As an example of the magnet's use, a profile of a sandwich structure made of several polymer layers is shown. In addition, a set of one-dimensional profiles of an alkyd coating, recorded during solvent loss and cross-linking, is presented. This example demonstrates quantitative T2 measurements at a resolution of 6.5 μm across a 70-μm-thick film.
ISSN:1090-7807
1096-0856
DOI:10.1006/jmre.1999.1772