Monitoring thickness deviations in planar multi-layer elastic structures using impedance signatures
In this letter, a low frequency ultrasonic resonance technique that operates in the 20 - 80 - kHz regime is presented that demonstrates detection of thickness changes on the order of ± 10 μ m . This measurement capability is a result of the direct correlation between the electrical impedance of an e...
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Veröffentlicht in: | The Journal of the Acoustical Society of America 2008-07, Vol.124 (1), p.32-35 |
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Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | In this letter, a low frequency ultrasonic resonance technique that operates in the
20
-
80
-
kHz
regime is presented that demonstrates detection of thickness changes on the order of
±
10
μ
m
. This measurement capability is a result of the direct correlation between the electrical impedance of an electro-acoustic transducer and the mechanical loading it experiences when placed in contact with a layered elastic structure. The
relative
frequency shifts of the resonances peaks can be estimated through a simple one-dimensional transmission model. Separate experimental measurements confirm this technique to be sensitive to subtle changes in the underlying layered elastic structure. |
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ISSN: | 0001-4966 1520-8524 |
DOI: | 10.1121/1.2770542 |